Structural characterization of liquid phase sintered silicon carbide by high-resolution X-ray diffractometry
نویسندگان
چکیده
منابع مشابه
Structural and Electrical Characterization of Sintered Silicon Nitride Ceramic
The electrical conduction phenomena, dielectric response and microstructure have been discussed in sintered silicon nitride ceramics at different temperature and frequencies. Microstructure and phase of the sintered samples was investigated by Scanning Electron Microscope (SEM) and X-ray diffractometer (XRD). The electrical conductivity, dielectric constant and dielectric loss increases exponen...
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ژورنال
عنوان ژورنال: Cerâmica
سال: 2005
ISSN: 0366-6913
DOI: 10.1590/s0366-69132005000200016